Dr. Yao Cheng is currently an Assistant Professor in the Industrial and Manufacturing Systems Engineering (IMSE), the University of Hong Kong. She got her Ph. D. degree from Rutgers, the state University of New Jersey under the supervision of distinguished professor Elsayed A. Elsayed. Her research has been published in top journals in reliability such as IEEE Transactions on Reliability and RESS. Her current research interests are:
• Reliability and Risk Modeling of Complex System;
• Reliability of Healthcare Device;
• Degradation, Non-destructive Test, Fatigue Test;
• Fault Diagnosis;
• Stochastic Modeling;
• Multi-sensor Data Analysis.
• have an undergraduate (UG) GPA no less than 3.0;
• be good at advanced mathematics and linear algebra;
• have basic skills in scientific writing;
• meet the English requirement of the university (TOFEL no less than 80 OR IELTS no less than 6 (with the minimum requirements 5.5 for each part).
Student will be preferred if:
• have the background of fluid mechanics and/or mechanics of materials and/or biomechanics and/or materials science, or relevant;
• be majored/minored in math/physics/computer science/material science;
• be experienced in simulation and/or data processing software.
Admitted students will have a guaranteed full scholarship (800,000 HKD for 4 years); students with strong background are encouraged to apply for the HKPFS (additionally 20,000 HKD per month, approximately) and a variety types of scholarship with the department’s nomination.
Students that are interested in the position are welcomed to send his/her transcript, CV and (research plan, if any) to yaocheng@hku.hk or yao.cheng.ise@gmail.com at any time.
Please note the deadline to apply the HKPFS is 1st December.
程遥博士目前为香港大学工业工程系助理教授。她于Rutgers, the state University of New Jersey 大学获得工业工程博士学位,博士期间导师为Elsayed A. Elsayed 教授。程遥博士研究方向主要包括:
• Reliability and Risk Modeling of Complex System;
• Reliability of Healthcare Device;
• Degradation, Non-destructive Test, Fatigue Test;
• Fault Diagnosis;
• Stochastic Modeling;
• Multi-sensor Data Analysis.
以上研究相关文章已被可靠性领域顶尖期刊 IEEE Transactions on Reliability 和 RESS 收录。